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Issue Date Title Author(s) Journal View
2012-10
Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core-Shell Nanowires

Fukata, N[Fukata, Naoki] ;  Mitome, M[Mitome, Masanori] ;  Sekiguchi, T[Sekiguchi, Takashi] ;  Bando, Y[Bando, Yoshio] ;  Kirkham, M[Kirkham, Melanie] ;  Hong, JI[Hong, Jung-Il] ;  Wang, ZL[Wang, Zhong Lin] ;  Snydert, RL[Snydert, Robert L.]

American Chemical Society, 2012-10

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